Intensity Exaggeration of Endohedral Metallofullerenes in Laser Desorption-Ionization Time-of-Flight Mass Spectrometry

Da Yong SUN Wen Guo XU and Shu Ying LIU

引用本文: Da Yong SUN,  Wen Guo XU,  and Shu Ying LIU. Intensity Exaggeration of Endohedral Metallofullerenes in Laser Desorption-Ionization Time-of-Flight Mass Spectrometry[J]. Chinese Chemical Letters, 1998, 9(8): 761-764. shu
Citation:  Da Yong SUN,  Wen Guo XU,  and Shu Ying LIU. Intensity Exaggeration of Endohedral Metallofullerenes in Laser Desorption-Ionization Time-of-Flight Mass Spectrometry[J]. Chinese Chemical Letters, 1998, 9(8): 761-764. shu

Intensity Exaggeration of Endohedral Metallofullerenes in Laser Desorption-Ionization Time-of-Flight Mass Spectrometry

摘要: The laser-desorption-ionization time-of-flight mass spectrometry and desorption-electron-ionization mass spectrometry were employed for the characterization of metallofullerenes extract. It was found that the relative intensities of metallofullerenes in this positive-ion, negative-ion LD-TOF MS and DEI MS were much different. This phenomenon should have relationship with the peculiar ionization energies and electron affinities of metallofullerenes.

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  • 收稿日期:  1997-09-29
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