Determination of Average Wall Thickness of Mesoporous Silica

Zhi Hong LI Yan Jun GONG Dong WU Yu Han SUN Jun WANG Yi LIU Bao Zhong DONG

引用本文: Zhi Hong LI,  Yan Jun GONG,  Dong WU,  Yu Han SUN,  Jun WANG,  Yi LIU,  Bao Zhong DONG. Determination of Average Wall Thickness of Mesoporous Silica[J]. Chinese Chemical Letters, 2001, 12(8): 741-744. shu
Citation:  Zhi Hong LI,  Yan Jun GONG,  Dong WU,  Yu Han SUN,  Jun WANG,  Yi LIU,  Bao Zhong DONG. Determination of Average Wall Thickness of Mesoporous Silica[J]. Chinese Chemical Letters, 2001, 12(8): 741-744. shu

Determination of Average Wall Thickness of Mesoporous Silica

  • 基金项目:

    This work was supported by the National Natural Science Foundation of China (Grant No.29625307 and No.29973057) and the National Key Basic Research Special Foundation (G20000480).

摘要: Small Angle X-ray Scattering (SAXS) experiment using Synchrotron Radiation as X-ray source was used to determine the average wall thickness of mesoporous silica prepared by condensation of tetraethylorthosilicate (TEOS) using non-ionic alkylpolyethyleneoxide (AEO9) surfactant as templates. The results agreed with that of high-resolution TEM (HRTEM) measurement.

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  • 收稿日期:  2001-01-31
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