引用本文:
Zhi Hong LI, Yan Jun GONG, Dong WU, Yu Han SUN, Jun WANG, Yi LIU, Bao Zhong DONG. Determination of Average Wall Thickness of Mesoporous Silica[J]. Chinese Chemical Letters,
2001, 12(8): 741-744.
Citation: Zhi Hong LI, Yan Jun GONG, Dong WU, Yu Han SUN, Jun WANG, Yi LIU, Bao Zhong DONG. Determination of Average Wall Thickness of Mesoporous Silica[J]. Chinese Chemical Letters, 2001, 12(8): 741-744.
Citation: Zhi Hong LI, Yan Jun GONG, Dong WU, Yu Han SUN, Jun WANG, Yi LIU, Bao Zhong DONG. Determination of Average Wall Thickness of Mesoporous Silica[J]. Chinese Chemical Letters, 2001, 12(8): 741-744.
Determination of Average Wall Thickness of Mesoporous Silica
摘要:
Small Angle X-ray Scattering (SAXS) experiment using Synchrotron Radiation as X-ray source was used to determine the average wall thickness of mesoporous silica prepared by condensation of tetraethylorthosilicate (TEOS) using non-ionic alkylpolyethyleneoxide (AEO9) surfactant as templates. The results agreed with that of high-resolution TEM (HRTEM) measurement.
English
Determination of Average Wall Thickness of Mesoporous Silica
Abstract:
Small Angle X-ray Scattering (SAXS) experiment using Synchrotron Radiation as X-ray source was used to determine the average wall thickness of mesoporous silica prepared by condensation of tetraethylorthosilicate (TEOS) using non-ionic alkylpolyethyleneoxide (AEO9) surfactant as templates. The results agreed with that of high-resolution TEM (HRTEM) measurement.
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