引用本文:
傅业伟, 高敏, 郑建斌. 二次微分简易示波伏安法测定痕量镍[J]. 应用化学,
2000, 17(3): 296-299.
Citation: FU Ye-Wei, GAO Min, ZHENG Jian-Bin. Determination of Trace Nickel by Second-order Differential Simple Oscillographic Voltammetry[J]. Chinese Journal of Applied Chemistry, 2000, 17(3): 296-299.
Citation: FU Ye-Wei, GAO Min, ZHENG Jian-Bin. Determination of Trace Nickel by Second-order Differential Simple Oscillographic Voltammetry[J]. Chinese Journal of Applied Chemistry, 2000, 17(3): 296-299.
二次微分简易示波伏安法测定痕量镍
English
Determination of Trace Nickel by Second-order Differential Simple Oscillographic Voltammetry
Abstract:
Trace nickel in waste solution from process of diamond cleaning by acid is determined by second order differential simple oscillographic voltammetry. The results show that in 0.20 mol/L NH4Ac-0.005 mol/L KNO3-0.02% diacetyldioxime solution the peak height of the oscillogram depends linearly on the concentration of Ni2+ ranged from 3×10-7 to 3.5×10-6mol/L. The regressive equation is Y=0.3583+1.365×105c(Ni2+) (mol/L). r=0.9970. The detection limit is 6×10-8mol/L. The method is simple, rapid and sensitive.
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Key words:
- oscillographic voltammetry
- / trace nickel
- / analysis
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