Citation: YUAN Bing-Kai, CHEN Peng-Cheng, ZHANG Jun, CHENG Zhi-Hai, WANG Chen, QIU Xiao-Hui. Research Progress in Atomic Resolution Microscopy[J]. Acta Physico-Chimica Sinica, ;2013, 29(07): 1370-1384. doi: 10.3866/PKU.WHXB201304191 shu

Research Progress in Atomic Resolution Microscopy

1.
1 National Center for Nanoscience and Technology, Beijing 100190, P. R. China;
2 Academy for Advanced Interdisciplinary Studies, Peking University, Beijing 100871, P. R. China

Received Date: 14 January 2013
Available Online: 19 April 2013
Fund Project: 国家重大科学研究计划(2012CB933001) (2012CB933001)国家自然科学基金(21173058)资助 (21173058)

Tremendous progress has been made in non-contact atomic force microscopy (NC-AFM) recently. The spatial resolution of NC-AFM imaging and spectroscopy of individual molecules on surfaces has reached true atomic resolution and bond differentiation level. Combination of NC-AFM with other scanning probe techniques can open a new way for materials, physics, chemistry, and biochemistry studies. In this review, we first introduce the basic principle of NC-AFM and qPlus sensor. The interaction force at atomic scale and precise measurement of short-range force are discussed. We summarize the recent advances in structural determination of organic molecules, chemical identification, electronic structure, and atomic manipulation at the atomic scale. In addition, we also discuss the application of Kelvin probe force microscopy (KPFM) in measurement of local contact potential difference (LCPD). Finally, perspectives and challenges in NC-AFM techniques are presented.
- Scanning probe microscopy,
- Non-contact atomic force microscopy,
- qPlus sensor,
- Chemical identification,
- Atomic manipulation,
- Electronic structure,
- Kelvin probe force microscopy
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