-
[1]
X. Liu, N. Fechler, M. Antonietti, Chem. Soc. Rev. 42 (2013) 8237–8265.
doi: 10.1039/C3CS60159E
-
[2]
X. Zhang, L. Zhang, T. Bo, et al., Chin. Chem. Lett. 33 (2022) 3527–3530.
doi: 10.1016/j.cclet.2022.03.026
-
[3]
Y.I. Chang, Nucl. Technol. 88 (1989) 129–138.
doi: 10.13182/NT88-129
-
[4]
E.Y. Choi, S.M. Jeong, Prog. Nat. Sci. Mater. 25 (2015) 572–582.
doi: 10.1016/j.pnsc.2015.11.001
-
[5]
S.E. Bae, Y.J. Park, S.K. Min, Y.H. Cho, K. Song, Electrochim. Acta 55 (2010) 3022–3025.
doi: 10.1016/j.electacta.2009.12.075
-
[6]
Y. Castrillejo, P. Fernández, J. Medina, P. Hernández, E. Barrado, Electrochim. Acta 56 (2011) 8638–8644.
doi: 10.1016/j.electacta.2011.07.059
-
[7]
P. Masset, R.J.M. Konings, R. Malmbeck, J. Serp, J.P. Glatz, J. Nucl. Mater. 344 (2005) 173–179.
doi: 10.1016/j.jnucmat.2005.04.038
-
[8]
E.Y. Choi, C.Y. Won, J.S. Cha, et al., J. Nucl. Mater. 444 (2014) 261–269.
doi: 10.1016/j.jnucmat.2013.09.061
-
[9]
J.M. Hur, J.S. Cha, E.Y. Choi, ECS Electrochem. Lett. 3 (2014) E5–E7.
doi: 10.1149/2.0071410eel
-
[10]
S.W. Kim, E.Y. Choi, W. Park, H.S. Im, J.M. Hur, Electrochem. Commun. 55 (2015) 14–17.
doi: 10.14257/astl.2015.98.04
-
[11]
S.W. Kim, M.K. Jeon, H.W. Kang, et al., J. Radioanal. Nucl. Chem. 310 (2016) 463–467.
doi: 10.1007/s10967-016-4786-5
-
[12]
A. Merwin, D. Chidambaram, Metall. Mater. Trans. A. 46 (2014) 536–544.
-
[13]
Y. Sakamura, M. Iizuka, Electrochim. Acta 189 (2016) 74–82.
doi: 10.1016/j.electacta.2015.12.086
-
[14]
R. Akolkar, R.M. Sankaran, J. Vac. Sci. Technol. A 31(2013) 5.
-
[15]
W. Chiang, D. Mariotti, R.M. Sankaran, J.G. Eden, K.K. Ostrikov, Adv. Mater. 32 (2020) 1905508.
doi: 10.1002/adma.201905508
-
[16]
C. Richmonds, M. Witzke, B. Bartling, et al., J. Am. Chem. Soc. 133 (2011) 17582–17585.
doi: 10.1021/ja207547b
-
[17]
P. Rumbach, M. Witzke, R.M. Sankaran, D.B. Go, J. Am. Chem. Soc. 135 (2013) 16264–16267.
doi: 10.1021/ja407149y
-
[18]
Z. Ren, Y. Lu, H. Yuan, et al., Acta Phys. Chim. Sin. 31 (2015) 1215–1218.
doi: 10.3866/PKU.WHXB201506102
-
[19]
A. Brenner, J.L. Sligh, J. Electrochem. Soc. 117 (1970) 602.
doi: 10.1149/1.2407586
-
[20]
S. Ghosh, R. Hawtof, P. Rumbach, et al., J. Electrochem. Soc. 164 (2017) D818–D824.
doi: 10.1149/2.0541713jes
-
[21]
M. Tokushige, T. Nishikiori, M.C. Lafouresse, et al., Electrochim. Acta 55 (2010) 8154–8159.
doi: 10.1016/j.electacta.2010.02.098
-
[22]
T. Oishi, T. Goto, Y. Ito, J. Electrochem. Soc. 149 (2002) D155–D159.
doi: 10.1149/1.1510842
-
[23]
T. Oishi, T. Goto, Y. Ito, Electrochemistry. 70 (2002) 697–700.
doi: 10.5796/electrochemistry.70.697
-
[24]
T. Oishi, T. Goto, Y. Ito, J. Electrochem. Soc. 150 (2003) D13–D16.
doi: 10.1149/1.1526111
-
[25]
T. Oishi, T. Hattori, T. Goto, Y. Ito, J. Electrochem. Soc. 149 (2002) D178–D181.
doi: 10.1149/1.1512673
-
[26]
T. Oishi, H. Kawamura, Y. Ito, J. Appl. Electrochem. 32 (2002) 819–824.
doi: 10.1023/A:1020183512146
-
[27]
H. Kawamura, K. Moritani, Y. Ito, Plasmas Ions. 1 (1998) 29–36.
doi: 10.1016/S1288-3255(99)80004-5
-
[28]
G. Wei, Y. Lu, S. Liu, et al., Chin. Chem. Lett. 32 (2021) 497–500.
doi: 10.1016/j.cclet.2020.04.019
-
[29]
G. Wei, X. Liu, Y. Lu, et al., Anal. Chem. 90 (2018) 13163–13166.
doi: 10.1021/acs.analchem.8b02872
-
[30]
M. Zhang, H. Wang, W. Han, et al., Sci. China. Chem. 57 (2014) 1477–1482.
doi: 10.1007/s11426-014-5214-8
-
[31]
M. Zhang, Y. Li, W. Hang, et al., Rare. Metal. Mat. Eng. 45 (2016) 1956–1960.
doi: 10.1016/S1875-5372(16)30153-9
-
[32]
Y. Xue, Q. Wang, Y.D. Yan, et al., Energy Proced. 39 (2013) 474–479.
doi: 10.1016/j.egypro.2013.07.239
-
[33]
M. Witzke, P. Rumbach, D.B. Go, R.M. Sankaran, J. Phys. D: Appl. Phys. 45 (2012) 442001.
doi: 10.1088/0022-3727/45/44/442001
-
[34]
D.M. Kolb, M. Przasnyski, H. Gerischer, J. Electroanal. Chem. 54 (1974) 25–38.
doi: 10.1016/S0022-0728(74)80377-3
-
[35]
L. Wang, Y.L. Liu, K. Liu, et al., Electrochim. Acta 147 (2014) 385–391.
doi: 10.1016/j.electacta.2014.08.113
-
[36]
M.R. Bermejo, J. Gómez, J. Medina, A.M. Martínez, Y. Castrillejo, J. Electroanal. Chem. 588 (2006) 253–266.
doi: 10.1016/j.jelechem.2005.12.031