Citation: LIU Meng-Xi, LI Shi-Chao, ZHA Ze-Qi, QIU Xiao-Hui. Research Progress and Applications of qPlus Noncontact Atomic Force Microscopy[J]. Acta Physico-Chimica Sinica, ;2017, 33(1): 183-197. doi: 10.3866/PKU.WHXB201609282 shu

Research Progress and Applications of qPlus Noncontact Atomic Force Microscopy

LIU Meng-Xi ^1, ,
LI Shi-Chao ^1,2 ,
ZHA Ze-Qi ^1,2 ,
QIU Xiao-Hui ¹

1.
Chinese Academy of Sciences Key Laboratory of Standardization and Measurement for Nanotechnology, Chinese Academy of Sciences Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, P. R. China;
2.
University of Chinese Academy of Sciences, Beijing 100049, P. R. China

Received Date: 28 July 2016
Revised Date: 27 September 2016

Fund Project: The project was supported by the Ministry of Science and Technology, China (2012CB933001) and National Natural Science Foundation of China (21425310).

Atomic force microscopy (AFM) is used to investigate surface structures by measuring the interaction force between the tip and sample. Non-contact AFM (NC-AFM) that incorporates a qPlus sensor further enhances the spatial resolution of scanning probe microscopy based on traditional AFM principles. In this perspective, we give a brief introduction to the mechanisms of high-resolution imaging and force measurements using NC-AFM. We then summarize recent applications of NC-AFM in the fields of on-surface chemical reactions, low-dimensional materials, surface charge distribution in molecules, as well as technical improvements and developments of NC-AFM technologies. The opportunities and challenges for NC-AFM technologies are also presented.
- Noncontact atomic force microscopy,
- qPlus sensor,
- High resolution imaging,
- Force spectroscopy,
- Kelvin probe force microscopy
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