Citation: LIU Xing-Rui, YAN Hui-Juan, WANG Dong, WAN Li-Jun. In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode[J]. Acta Physico-Chimica Sinica, ;2016, 32(1): 283-289. doi: 10.3866/PKU.WHXB201511132 shu

In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode

1.
CAS Key Laboratory of Molecular Nanostructure and Nanotechnology, Beijing National Laboratory for Molecular Sciences, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, P. R. China

Corresponding author: WANG Dong,
Received Date: 2 October 2015
Available Online: 12 November 2015
Fund Project: 科技部(2011YQ03012415,2011CB932302) (2011YQ03012415,2011CB932302)国家自然科学基金(21127901,21573252)资助项目 (21127901,21573252)

The interfacial morphology of a single crystal Si wafer anode during the first discharging-charging cycle was investigated using in situ atomic force microscopy (AFM). The solid-electrolyte interphase (SEI) began to grow from 1.5 V, developing rapidly between 1.25 and 1.0 V, and slowed down after 0.6 V. The morphology suggested that the SEI had a layered structure. The outer layer of SEI was soft and easy to be scraped off during the AFM tip scanning. The underlayer of SEI had granular features. During the lithiation process, the Si surface became grainy because of the insertion of Li ions. After the first cycle, the Si surface was completely covered by inhomogeneous SEI. The thickness of the SEI was approximately 10-40 nm.
- Si anode,
- Solid electrolyte interphase,
- In situ atomic force microscopy
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