Citation:
ZHANG Zhe, LU Dan-Feng, QI Zhi-Mei. Surface Plasmon Resonance Sensing Properties of Nanoporous ld Thin Films[J]. Acta Physico-Chimica Sinica
doi:
10.3866/PKU.WHXB201302222
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Nanoporous ld films were prepared by immersing Au-Ag alloy films with a thickness of ca 60 nm sputtered on glass substrates in nitrate acid to remove the Ag component. Using a home-made wavelength-interrogated surface plasmon resonance (SPR) sensor platform, the influence of the immersion time on the SPR properties of the nanoporous ld film was investigated. If the nanoporous ld film was immersed in aqueous solution, SPR was not detected in the wavelength range from 400 to 900 nm. However, when the nanoporous ld films were exposed to air, a strong SPR absorption peak was detected in the same spectral range. The peak position gradually moved to longer wavelength as the immersion time extended. The SPR of the nanoporous ld film in air enables the film to be used for in situ monitoring of gas-phase molecular adsorption and ex situ detection of biochemical molecules adsorbed in the liquid phase. Ex situ detection of three kinds of small molecules (L-glutathione, L-cysteine, and cysteamine) adsorbed to the nanoporous ld film was fulfilled. The results were compared with those obtained using a conventional SPR chip with a dense ld film, revealing that the nanoporous ld films have a higher sensitivity and lower detection limit than the dense ld layer because of their larger surface area. Adsorption of ethanol molecules in the gas phase was monitored in situ, and the time required to reach adsorption equilibrium was about 160 min.
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[1]
-
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[1]
(1) Fujita, T.; Guan, P.; Mckenna, K.; Lang, X.; Hirata, A.; Zhang,L.; Tokunaga, T.; Arai, S.; Yamamoto, Y.; Tanaka, N.; Ishikawa,Y.; Asao, N.; Yamamoto, Y.; Erlebacher, J.; Chen, M. Nat.Mater. 2012, 11, 775. doi: 10.1038/nmat3391
-
[2]
(2) Detsi, E.; Punzhin, S.; Rao, J.; Onck, P. R.; De Hosson, J. T. M.ACS Nano 2012, 6, 3734. doi: 10.1021/nn300179n
-
[3]
(3) Feng, J.;Wu, J. Small 2012, 8, 3786. doi: 10.1002/small.201201591
-
[4]
(4) Fang, C.; Bandaru, N. M.; Ellis, A. V.; Voelcker, N. H. J. Mater.Chem. 2012, 22, 2952. doi: 10.1039/c2jm14889g
-
[5]
(5) Cherevko, S.; Chung, C. H. Electrochem. Commun. 2011, 13,16. doi: 10.1016/j.elecom.2010.11.001
-
[6]
(6) Wittstock, A.;Wichmann, A.; Biener, J.; Bäumer, M. FaradayDiscuss 2011, 152, 87. doi: 10.1039/c1fd00022e
-
[7]
(7) Jiao, Y.; Ryckman, J. D.; Ciesielski, P. N.; Escobar, C. A.;Jennings, G. K.;Weiss, S. M. Nanotechnology 2011, 22,295302. doi: 10.1088/0957-4484/22/29/295302
-
[8]
(8) Wittstock, A.; Zielasek, V.; Biener, J.; Friend, C. M.; Bumer, M.Science 2010, 327, 319. doi: 10.1126/science.1183591
-
[9]
(9) Musat, R.; Moreau, S.; Poidevin, F.; Mathon, M. H.; Pommeret,S.; Renault, J. P. Phys. Chem. Chem. Phys. 2010, 12, 12868.doi: 10.1039/c0cp00967a
-
[10]
(10) Qian, L.; Shen,W.; Qin, G.W.; Das, B. Nanotechnology 2010,21, 305705. doi: 10.1088/0957-4484/21/30/305705
-
[11]
(11) Seker, E.; Reed, M. L.; Begley, M. R. Materials 2009, 2, 2188.doi: 10.3390/ma2042188
-
[12]
(12) Qiu, H. J.; Xu, C. X.; Ji, G. L.; Huang, X. R.; Han, S. H.; Ding,Y.; Qu, Y. B. Acta Chim. Sin. 2008, 66, 2075. [邱华军, 徐彩霞, 姬广磊, 黄锡荣, 韩书华, 丁轶, 曲音波. 化学学报, 2008,66, 2075.]
-
[13]
(13) Wang, J. L.; Li, S.; Xia, R.; Zhang, X.; Chen, Y. F.Nanotechnology and Precision Engineering 2012, 10, 30.[王建立, 李晟, 夏热, 张兴, 陈云飞. 纳米技术与精密工程, 2012, 10, 30.]
-
[14]
(14) Wang, D.; Schaaf, P. J. Mater. Chem. 2012, 22, 5344. doi: 10.1039/c2jm15727f
-
[15]
(15) Abraham, A.; Mihaliuk, E.; Kumar, B.; Legleiter, J.; Gullion, T.J. Phys. Chem. C 2010, 114, 18109. doi: 10.1021/jp107112b
-
[16]
(16) Gutiérrez, A.; Osegueda, S.; Gutiérrez-Granados, S.; Alatorre,A.; García, M. G.; dínez, L. A. Electroanalysis 2008, 20,2294. doi: 10.1002/elan.200804324
-
[17]
(17) Sudeep, P. K.; Joseph, S. T. S.; Thomas, K. G. J. Am. Chem.Soc. 2005, 127, 6516. doi: 10.1021/ja051145e
-
[18]
(18) Ruffato, G.; Romanato, F.; Garoli, D.; Cattarin, S. Opt. Express2011, 19, 13164. doi: 10.1364/OE.19.013164
-
[19]
(19) Lang, X.; Qian, L.; Guan, P.; Zi, J.; Chen, M. Appl. Phys. Lett.2011, 98, 093701. doi: 10.1063/1.3560482
-
[20]
(20) Yang, Y.;Wu, Y. H.; Hao, P.; Zhang, Z. Q. Spectroscopy andSpectral Analysis 2010, 30, 1898. [杨胤, 吴一辉, 郝鹏,张志强. 光谱学与光谱分析, 2010, 30, 1898.]
-
[21]
(21) Ahi, S.; Caneron, P. J.; Liu, J.; Knoll,W.; Erlebacher, J.; Yu, F.Plamonics 2008, 3, 13. doi: 10.1007/s11468-007-9048-5
-
[22]
(22) Maaroof, A. I.; Gentle, A.; Smith, G. B.; Cortie, M. B. J. Phys.D: Appl. Phys. 2007, 40, 5675. doi: 10.1088/0022-3727/40/18/024
-
[23]
(23) Yu, F.; Ahi, S.; Caminade, A. M.; Majoral, J. P.; Knoll,W.;Erlebacher, J. Anal. Chem. 2006, 78, 7346. doi: 10.1021/ac060829h
-
[24]
(24) Qi, Z. M.; Honma, I.; Zhou, H. S. Appl. Phys. Lett. 2007, 90,011102. doi: 10.1063/1.2424643
-
[25]
(25) Zhang, Z.; Lu, D. F.; Qi, Z. M. J. Phys. Chem. C 2012, 116,3342. doi: 10.1021/jp2102429
-
[26]
(26) Zhang, Z.; Lu, D. F.; Liu, Q.; Qi, Z. M.; Yang, L. B.; Liu, J. H.Analyst 2012, 137, 4822. doi: 10.1039/c2an16057a
-
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