Citation: TIAN Hong, ZHANG -Lei, XU Yao, WU Dong, WU Zhong-Hua, LÜ Hai-Bing, YUAN Xiao-Dong. Comparision of Silica Anti-Reflective Films Obtained via a Sol-Gel Process in the Presence of PEG or PVP[J]. Acta Physico-Chimica Sinica, ;2012, 28(05): 1197-1205. doi: 10.3866/PKU.WHXB201202231
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The different effects of poly(ethylene glycol) (PEG) and poly(vinylpyrrolidone) (PVP) on the structure and laser-induced damage threshold of sol-gel silica anti-reflective films were investigated. The results of dynamic light-scattering, transmission electron microscopy (TEM), and small-angle X-ray scattering (SAXS) showed that PEG could prompt silica particles to form uniform clusters, whereas in the PVP-modified sol, the growth of silica particles was restricted. This was a result of the strong hydrogen bonds between Si―OH groups and PVP molecules Multi-fractal spectrum (MFS) analysis suggested that PEG improved the uniformity of the silica film but PVP reduced it, therefore the laser-damage resistance of the PEG-modified silica film was enhanced, but that of the PVP-modified silica film was weakened. 29Si magic-angle spinning nuclear magnetic responance (MAS NMR) showed that PEG improved the condensation of Si ―O tetrahedron, but PVP did not. This led to differences between the laser-damage resistances of PEG-modified silica films and PVP-modified silica films.
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Keywords:
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Laser-induced damage
, - Anti-reflection,
- Optical film,
- Surface fractal
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