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Citation: AO Jian-Ping, SUN Guo-Zhong, YAN Li, KANG Feng, YANG Liang, HE Qing, ZHOU Zhi-Qiang, LI Feng-Yan, SUN Yun. Properties of One-Step Electrodeposited Cu(In_1-x, Ga_x)Se₂ Thin Films[J]. Acta Physico-Chimica Sinica, ;2008, 24(06): 1073-1079. doi: 10.3866/PKU.WHXB20080628 shu

Properties of One-Step Electrodeposited Cu(In_1-x, Ga_x)Se₂ Thin Films

1.
Tianjin Key Laboratory of Photo-Electronic Thin Film Devices and Technology, Institute of Photo-Electronic Thin Film Devices and Technique, Nankai University, Tianjin 300071, P. R. China

Received Date: 16 November 2007
Available Online: 21 April 2008

One-step electrodeposition(ED) of Cu(In1-x, Gax)Se2 (CIGS) thin films on Mo/glass substrates from aqueous solutions containing CuCl2, InCl3, GaCl3, and H2SeO3 was studied. In order to stabilize the solutions, they were buffered using a potassium biphthalate/sulfamic acid mixture giving a bath of pH 2.5. The type of the solutions would influence Ga concentration in the CIGS films. In general, CIGS thin film is called stoichiometric compound when the molar ratio of Cu to In+Ga is 1, and when the ratio is in the range of 0.8-1, it is called near stoichiometric and slightly Cu-poor or In-rich CIGS compound. As-deposited films were near stoichiometric and slightly Cu-poor CIGS precursors with smooth, compact, crack-free surface by the optimization of the solution composition and the deposition condition. The electrodeposition mechanisms of CIGS on Mo substrates were studied by cyclic voltammetry. The results showed that Se4+ was first reduced to Se, and then Cu2+, In3 +, and Ga3+ were deposited via the induced co- deposition mechanism at more positive potentials than they were reduced. As-deposited films were selenized and recrystallized at 550 ℃ in Se vapor with a Se source temperature of 280 ℃, which improved crystal structure of the films and changed little the compositions of ED-CIGS thin films, but resulted in cracking of the films.
- Electrodeposition; Cu(In1-x, Gax)Se2 thin film; Cyclic voltammetry; pH buffer solution
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Properties of One-Step Electrodeposited Cu(In1-x, Gax)Se2 Thin Films

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通讯作者: 陈斌, bchen63@163.com

Properties of One-Step Electrodeposited Cu(In_1-x, Ga_x)Se₂ Thin Films