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Citation: YANG Hai-Bo, HU Ming, LIANG Ji-Ran, ZHANG Xu-Rui, LIU Zhi-Gang. Microstructure, Nano-Mechanical and Temperature Sensitive Properties of VO_x/Porous Silicon/Si Structure[J]. Acta Physico-Chimica Sinica, ;2008, 24(06): 1017-1022. doi: 10.3866/PKU.WHXB20080618 shu

Microstructure, Nano-Mechanical and Temperature Sensitive Properties of VO_x/Porous Silicon/Si Structure

1.
School of Electronic Information Engineering, Tianjin University, Tianjin 300072, P. R. China

Received Date: 15 January 2008
Available Online: 25 April 2008

Porous silicon (PS) was formed on the surface of silicon wafer by electrochemical etching method under different current densities. In order to form VOx/PS/Si structure, vanadium oxide thin films were deposited on PS surface utilizing novel facing targets DC reactive sputtering technique. Field emission scanning electron microscope (FESEM) was utilized to observe the microstructure of PS and VOx/PS/Si structure, the nano-mechanical property of VOx/PS/Si structure was studied by nanoindentor instrument, and the temperature sensitive property was analyzed with resistance-power curves. The results showed that the average pore sizes of PS samples prepared under current densities of 40 and 80 mA·cm-2 were 18 and 24 nm, and the thermal conductivities tested by micro Raman spectroscopy were 3.282 and 1.278 kW·K-1, respectively. The average speeds of resistance varying with power for VOx/PS/Si structure were 60×10⁹ and 100×10⁹ Ω·W-1, and the nano-hardness were 1.917 and 0.928 GPa, respectively. The experimental results indicated that the microstructure of PS had great influence on the nano-mechanical property and temperature sensitivity of VOx/PS/Si structure; this structure formed on PS with high porosity had better temperature sensitivity than PS with low porosity, but a worse mechanical stability.
- Vanadiumoxide; Porous silicon; Microstructure; Nano-mechanical; Temperature sensitivity
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沈阳化工大学材料科学与工程学院沈阳 110142

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Microstructure, Nano-Mechanical and Temperature Sensitive Properties of VOx/Porous Silicon/Si Structure

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通讯作者: 陈斌, bchen63@163.com

Microstructure, Nano-Mechanical and Temperature Sensitive Properties of VO_x/Porous Silicon/Si Structure