Citation: Li Shu-Hong, Ma Shi-Hong, Li Bo, Sun Jing-Lan, Wang Gen-Shui, Meng Xiang-Jian, Chu Jun-Hao, Wang Wen-Cheng. Thickness Dependence of Ferroelectricity in Hemic yanine Langmuir-Blodgett Multilayer Films[J]. Acta Physico-Chimica Sinica, ;2004, 20(10): 1253-1257. doi: 10.3866/PKU.WHXB20041018 shu

Thickness Dependence of Ferroelectricity in Hemic yanine Langmuir-Blodgett Multilayer Films

  • Received Date: 15 March 2004
    Available Online: 15 October 2004

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