Citation: LING Meng-Xuan,  LU Su-Min,  SUN Hao,  LIU Dan,  BIAN Xi-Hui. X-ray Diffraction Spectral Denoising Based on Empirical Mode Decomposition and t-Test[J]. Chinese Journal of Analytical Chemistry, ;2023, 51(3): 445-453. doi: 10.19756/j.issn.0253-3820.221534 shu

X-ray Diffraction Spectral Denoising Based on Empirical Mode Decomposition and t-Test

  • Corresponding author: BIAN Xi-Hui, bianxihui@163.com
  • Received Date: 30 October 2022
    Revised Date: 3 February 2023

    Fund Project: Supported by the Open Projects Fund of National Medical Products Administration Key Laboratory for Technology Research and Evaluation of Drug Products (No. 2022TREDP04) and the Tianjin Science and Technology Program (No. 21ZYJDJC00100).

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