Citation: CHEN Ran, MEN Yongfeng. Calibration of Absolute Scattering Intensity in Small-angle X-Ray Scattering[J]. Chinese Journal of Applied Chemistry, ;2016, 33(7): 774-779. doi: 10.11944/j.issn.1000-0518.2016.07.150462 shu

Calibration of Absolute Scattering Intensity in Small-angle X-Ray Scattering

CHEN Ran ^a,b ,
MEN Yongfeng ^a,,

a.
a. State Key Laboratory of Polymer Physics and Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, China;
b.
b. University of Chinese Academy of Science, Beijing 130049, China

Corresponding author: MEN Yongfeng,
Received Date: 28 December 2015
Available Online: 18 April 2016
Fund Project:

Absolute calibration of small-angle X-ray scattering data is necessary for determining quantitative parameters of microstructure of the samples. This work details the absolute calibration method by the measurement of incident beam directly with Pilatus detector. Absolute calibration of standard sample(water) was carried out to verify this method. Application of this method to a poly(methyl methacrylate) colloidal dispersion and a high density polyethylene were performed to obtain the volume fraction and specific surface of scatters. The volume fraction of polymethylmethacrylate(PMMA) is close to the result calculated by density. The specific surface of quenched high density polyethylene is larger than slow cooled sample.
- calibration,
- absolute intensity,
- small-angle X-ray scattering
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