Citation: Yi-ning He, Xiao Liu, Qi Liao, Jian-jun Zhou, Hong Huo, Lin Li. Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals[J]. Chinese Journal of Polymer Science, ;2014, 32(9): 1253-1259. doi: 10.1007/s10118-014-1504-z shu

Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals

Yi-ning He ¹ ,
Xiao Liu ¹ ,
Qi Liao ² ,
Jian-jun Zhou ^1,, ,
Hong Huo ¹ ,
Lin Li ¹

1.
Beijing Key Laboratory of Energy Transition and Storage Materials, College of Chemistry, Beijing Normal University, Beijing 100875, China
2.
Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China

Corresponding author: Jian-jun Zhou,
Received Date: 17 April 2014
Revised Date: 12 May 2014

Fund Project: This work was financially supported by the Natural Science Foundation of China (Nos. 20634050, 20804053 and 21074015), the Science Foundation of Beijing (No. 212030), the National Basic Research Program of China (973 Project No. 2011CB605605) and the Fundamental Research Funds for the Central Universities.

Poly(ethylene oxide) multi-layer crystals were obtained and the re-crystallization behavior was studied to give insight into how melt thickness and temperature affect the lamellar orientation. For a special re-crystallization temperature, there exists a critical transition thickness range for the occurrence of edge-on lamellar orientation. Below the critical thickness, only flat-on lamellae were observed. While above the critical thickness, both flat-on and edge-on lamellae were found and the proportion of the edge-on lamellae increases with thickness. At low re-crystallization temperatures (below 30 ℃), the critical transition thickness gradually increases from about 15 nm to 35 nm when the re-crystallization temperature was increased from 20 ℃ to 30 ℃. However, when the re-crystallization temperature is above 30 ℃, the critical transition thickness becomes constant. Our results demonstrated that the lamellar orientation could be specially modified by changing the melt thickness and re-crystallization temperature.
- PEO multi-layer crystal,
- Lamellar orientation,
- Re-crystallization temperature
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