Citation: Yu-jing Tang a, Zhi-yong Jiang a, Hans-Friedrich Enderle b, Dieter Lilge b, Stephan V. Roth c, Rainer Gehrke c, Jens Rieger d, Li-jia An a, Yong-feng Mena. MAPPING THE DAMAGED ZONE AROUND THE CRACK TIP IN HIGH DENSITY POLYETHYLENE WITH SYNCHROTRON MICROFOCUS SMALL ANGLE X-RAY SCATTERING TECHNIQUE[J]. Chinese Journal of Polymer Science, ;2010, 28(2): 165-170. doi: 10.1007/s10118-010-8243-6 shu

MAPPING THE DAMAGED ZONE AROUND THE CRACK TIP IN HIGH DENSITY POLYETHYLENE WITH SYNCHROTRON MICROFOCUS SMALL ANGLE X-RAY SCATTERING TECHNIQUE

  • Received Date: 26 December 2008
    Revised Date: 3 February 2009

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    沈阳化工大学材料科学与工程学院 沈阳 110142

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