
Citation: SU Tong-Yu, XIAO Xiao-Jian, YE Meng-Wei, TIAN Xiao-Chun, LIN Jian-Hang, TANG Jing. Preparation of AuPd and Au Microarrays on ITO and Characterization of Electrocatalytic Activity with SECM[J]. Acta Physico-Chimica Sinica, 2014, 30(2): 325-330. doi: 10.3866/PKU.WHXB201312242

ITO上AuPd合金和Au阵列图案的制备及电催化活性的SECM表征
利用电化学湿法印章技术在氧化铟锡(ITO)导电玻璃上制备AuPd合金和Au的双组分阵列图案. 采用具有微浮雕图案的琼脂糖印章存储足够多的溶液,并通过控制电沉积的时间来控制图案厚度. 应用场发射扫描电子显微镜(FE-SEM),X射线能谱分析(EDX)和原子力显微镜(AFM)分别对ITO表面上的AuPd合金和Au的形貌和组分进行表征,并通过循环伏安(CV)技术和扫描电化学显微镜(SECM)研究比较了Au和AuPd合金的催化活性. 利用扫描电化学显微镜(SECM)的针尖产生-基底收集(TG-SC)模式和氧化还原竞争(RC)模式,发现Au电极对二茂铁甲醇氧化物(FcMeOH+)电催化还原能力高于AuPd合金电极,而在AuPd合金上催化还原H2O2的能力显著高于Au.
English
Preparation of AuPd and Au Microarrays on ITO and Characterization of Electrocatalytic Activity with SECM
Au and AuPd arrays were deposited onto an indium tin oxide (ITO) surface by the electrochemical wet stamping method. Agarose stamp with microstructures and solution was used to electrodeposit and generate patterns of a certain thickness. Field emission scanning electron microscopy (FE-SEM), energy-dispersive X-ray analysis (EDX), and atomic force microscopy (AFM) were employed to characterize the morphology and components on the surface. Tip generation-substrate collection (TG-SC) mode and redox-competition (RC) mode of scanning electrochemical microscopy (SECM) combined with cyclic voltammetry were used to explore the electrocatalytic activity of the alloy arrays. In the study of the electrocatalysis, AuPd exhibited higher activity for the reduction of H2O2 than pure Au, but lower activity for that of ferrocenemethanol oxide (FcMeOH+).
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[1]
(1) Lee, K. R.; Jung, Y.;Woo, S. I. ACS Combinatorial Science2012, 14, 10. doi: 10.1021/co200056d
(1) Lee, K. R.; Jung, Y.;Woo, S. I. ACS Combinatorial Science2012, 14, 10. doi: 10.1021/co200056d
-
[2]
(2) Walsh, D. A.; Fernández, J. L.; Bard, A. J. Journal of The Electrochemical Society 2006, 153, E99.(2) Walsh, D. A.; Fernández, J. L.; Bard, A. J. Journal of The Electrochemical Society 2006, 153, E99.
-
[3]
(3) Tang,W.; Jayaraman, S.; Jaramillo, T. F.; Stucky, G. D.;McFarland, E.W. Journal of Physical Chemistry C 2009, 113,5014. doi: 10.1021/jp8089209(3) Tang,W.; Jayaraman, S.; Jaramillo, T. F.; Stucky, G. D.;McFarland, E.W. Journal of Physical Chemistry C 2009, 113,5014. doi: 10.1021/jp8089209
-
[4]
(4) Qiu, H.; Zou, F. ACS Applied Materials & Interfaces 2013, 5,6775. doi: 10.1021/am4022472(4) Qiu, H.; Zou, F. ACS Applied Materials & Interfaces 2013, 5,6775. doi: 10.1021/am4022472
-
[5]
(5) Lee, Y.W.; Kim, M.; Kim, Y.; Kang, S.W.; Lee, J. H.; Han, S.W. Journal of Physical Chemistry C 2010, 114, 7689. doi: 10.1021/jp9119588(5) Lee, Y.W.; Kim, M.; Kim, Y.; Kang, S.W.; Lee, J. H.; Han, S.W. Journal of Physical Chemistry C 2010, 114, 7689. doi: 10.1021/jp9119588
-
[6]
(6) Hernández-Fernández, P.; Rojas, S.; Ocón, P.; Gómez de laFuente, J. L.; San Fabián, J.; Sanza, J.; Peña, M. A.; García-García, F. J.; Terreros, P.; Fierro, J. L. G. Journal of Physical Chemistry C 2007, 111, 2913. doi: 10.1021/jp066812k(6) Hernández-Fernández, P.; Rojas, S.; Ocón, P.; Gómez de laFuente, J. L.; San Fabián, J.; Sanza, J.; Peña, M. A.; García-García, F. J.; Terreros, P.; Fierro, J. L. G. Journal of Physical Chemistry C 2007, 111, 2913. doi: 10.1021/jp066812k
-
[7]
(7) Lee, K. R.; Jung, Y.;Woo, S. I. ACS Combinatorial Science2011, 14, 10.(7) Lee, K. R.; Jung, Y.;Woo, S. I. ACS Combinatorial Science2011, 14, 10.
-
[8]
(8) Choi, S. I.; Lee, S. U.; Kim,W. Y.; Choi, R.; Hong, K.; Nam, K.M.; Han, S.W.; Park, J. T. ACS Applied Materials & Interfaces2012, 4, 6228. doi: 10.1021/am301824w(8) Choi, S. I.; Lee, S. U.; Kim,W. Y.; Choi, R.; Hong, K.; Nam, K.M.; Han, S.W.; Park, J. T. ACS Applied Materials & Interfaces2012, 4, 6228. doi: 10.1021/am301824w
-
[9]
(9) Fernández, J. L.; Bard, A. J. Analytical Chemistry 2003, 75,2967. doi: 10.1021/ac0340354(9) Fernández, J. L.; Bard, A. J. Analytical Chemistry 2003, 75,2967. doi: 10.1021/ac0340354
-
[10]
(10) Calabretta, A.;Wasserberg, D.; Posthuma-Trumpie, G. A.;Subramaniam, V.; van Amerongen, A.; Corradini, R.; Tedeschi,T.; Sforza, S.; Reinhoudt, D. N.; Marchelli, R.; Huskens, J.;Jonkheijm, P. Langmuir 2010, 27, 1536.(10) Calabretta, A.;Wasserberg, D.; Posthuma-Trumpie, G. A.;Subramaniam, V.; van Amerongen, A.; Corradini, R.; Tedeschi,T.; Sforza, S.; Reinhoudt, D. N.; Marchelli, R.; Huskens, J.;Jonkheijm, P. Langmuir 2010, 27, 1536.
-
[11]
(11) Nagaiah, T. C.; Schäfer, D.; Schuhmann,W.; Dimcheva, N.Analytical Chemistry 2013, 85, 7897.(11) Nagaiah, T. C.; Schäfer, D.; Schuhmann,W.; Dimcheva, N.Analytical Chemistry 2013, 85, 7897.
-
[12]
(12) Wendeln, C.; Ravoo, B. J. Langmuir 2012, 28, 5527. doi: 10.1021/la204721x(12) Wendeln, C.; Ravoo, B. J. Langmuir 2012, 28, 5527. doi: 10.1021/la204721x
-
[13]
(13) Lin, C. L.; Rodríguez-López, J. N.; Bard, A. J. Analytical Chemistry 2009, 81, 8868. doi: 10.1021/ac901434a(13) Lin, C. L.; Rodríguez-López, J. N.; Bard, A. J. Analytical Chemistry 2009, 81, 8868. doi: 10.1021/ac901434a
-
[14]
(14) Zhang, L.; Zhuang, J. L.; Ma, X. Z.; Tang, J.; Tian, Z.W.Electrochemistry Communications 2007, 9, 2529. doi: 10.1016/j.elecom.2007.07.035(14) Zhang, L.; Zhuang, J. L.; Ma, X. Z.; Tang, J.; Tian, Z.W.Electrochemistry Communications 2007, 9, 2529. doi: 10.1016/j.elecom.2007.07.035
-
[15]
(15) Tang, J.; Zhuang, J. L.; Zhang, L.;Wang,W. H.; Tian, Z.W.Electrochimica Acta 2008, 53, 5628. doi: 10.1016/j.electacta.2008.03.006(15) Tang, J.; Zhuang, J. L.; Zhang, L.;Wang,W. H.; Tian, Z.W.Electrochimica Acta 2008, 53, 5628. doi: 10.1016/j.electacta.2008.03.006
-
[16]
(16) Tang, J.; Zhang, L.; Tian, X. Journal of Micromechanics and Microengineering 2010, 20, 115030. doi: 10.1088/0960-1317/20/11/115030(16) Tang, J.; Zhang, L.; Tian, X. Journal of Micromechanics and Microengineering 2010, 20, 115030. doi: 10.1088/0960-1317/20/11/115030
-
[17]
(17) Bowyer,W. J.; Xie, J.; Engstrom, R. C. Analytical Chemistry1996, 68, 2005. doi: 10.1021/ac9512259(17) Bowyer,W. J.; Xie, J.; Engstrom, R. C. Analytical Chemistry1996, 68, 2005. doi: 10.1021/ac9512259
-
[18]
(18) Shan, X.; Diez-Perez, I.;Wang, L.;Wiktor, P.; Gu, Y.; Zhang,L.;Wang,W.; Lu, J.;Wang, S.; ng, Q.; Li, J.; Tao, N. Nat. Nano 2012, 7, 668. doi: 10.1038/nnano.2012.134(18) Shan, X.; Diez-Perez, I.;Wang, L.;Wiktor, P.; Gu, Y.; Zhang,L.;Wang,W.; Lu, J.;Wang, S.; ng, Q.; Li, J.; Tao, N. Nat. Nano 2012, 7, 668. doi: 10.1038/nnano.2012.134
-
[19]
(19) Lin, X.; Zheng, L.; Gao, G.; Chi, Y.; Chen, G. Analytical Chemistry 2012, 84, 7700. doi: 10.1021/ac300875x(19) Lin, X.; Zheng, L.; Gao, G.; Chi, Y.; Chen, G. Analytical Chemistry 2012, 84, 7700. doi: 10.1021/ac300875x
-
[20]
(20) Mezour, M. A.; Cornut, R.; Hussien, E. M.; Morin, M.;Mauzeroll, J. Langmuir 2010, 26, 13000. doi: 10.1021/la100444n(20) Mezour, M. A.; Cornut, R.; Hussien, E. M.; Morin, M.;Mauzeroll, J. Langmuir 2010, 26, 13000. doi: 10.1021/la100444n
-
[21]
(21) Dumitrescu, I.; Dudin, P. V.; Edgeworth, J. P.; Macpherson, J.V.; Unwin, P. R. Journal of Physical Chemistry C 2010, 114,2633.(21) Dumitrescu, I.; Dudin, P. V.; Edgeworth, J. P.; Macpherson, J.V.; Unwin, P. R. Journal of Physical Chemistry C 2010, 114,2633.
-
[22]
(22) Sanchez-Sanchez, C. M.; Rodriguez-Lopez, J.; Bard, A. J.Analytical Chemistry 2008, 80, 3254. doi: 10.1021/ac702453n(22) Sanchez-Sanchez, C. M.; Rodriguez-Lopez, J.; Bard, A. J.Analytical Chemistry 2008, 80, 3254. doi: 10.1021/ac702453n
-
[23]
(23) Minguzzi, A.; Alpuche-Aviles, M. A.; López, J. R.; Rondinini,S.; Bard, A. J. Analytical Chemistry 2008, 80, 4055. doi: 10.1021/ac8001287(23) Minguzzi, A.; Alpuche-Aviles, M. A.; López, J. R.; Rondinini,S.; Bard, A. J. Analytical Chemistry 2008, 80, 4055. doi: 10.1021/ac8001287
-
[24]
(24) Weng, Y. C.; Fan, F. R. F.; Bard, A. J. Journal of the American Chemical Society 2005, 127, 17576. doi: 10.1021/ja054812c(24) Weng, Y. C.; Fan, F. R. F.; Bard, A. J. Journal of the American Chemical Society 2005, 127, 17576. doi: 10.1021/ja054812c
-
[25]
(25) Jayaraman, S.; Hillier, A. C. Journal of Physical Chemistry B2003, 107, 5221. doi: 10.1021/jp0274886(25) Jayaraman, S.; Hillier, A. C. Journal of Physical Chemistry B2003, 107, 5221. doi: 10.1021/jp0274886
-
[26]
(26) Zeradjanin, A. R.; Schilling, T.; Seisel, S.; Bron, M.;Schuhmann,W. Analytical Chemistry 2011, 83, 7645. doi: 10.1021/ac200677g(26) Zeradjanin, A. R.; Schilling, T.; Seisel, S.; Bron, M.;Schuhmann,W. Analytical Chemistry 2011, 83, 7645. doi: 10.1021/ac200677g
-
[27]
(27) Nagaiah, T. C.; Maljusch, A.; Chen, X.; Bron, M.; Schuhmann,W. ChemPhysChem 2009, 10, 2711. doi: 10.1002/cphc.v10:15(27) Nagaiah, T. C.; Maljusch, A.; Chen, X.; Bron, M.; Schuhmann,W. ChemPhysChem 2009, 10, 2711. doi: 10.1002/cphc.v10:15
-
[28]
(28) Eckhard, K.; Chen, X.; Turcu, F.; Schuhmann,W. Physical Chemistry Chemical Physics 2006, 8, 5359. doi: 10.1039/b609511a(28) Eckhard, K.; Chen, X.; Turcu, F.; Schuhmann,W. Physical Chemistry Chemical Physics 2006, 8, 5359. doi: 10.1039/b609511a
-
[29]
(29) Mayer, M.; Yang, J.; Gitlin, I.; Gracias, D. H.; Whitesides, G.M. Proteomics 2004, 4, 2366.(29) Mayer, M.; Yang, J.; Gitlin, I.; Gracias, D. H.; Whitesides, G.M. Proteomics 2004, 4, 2366.
-
[30]
(30) Tang, J.; Tian, X. C.; Pang,W. H.; Liu, Y. Q.; Lin, J. H.Electrochimica Acta 2012, 81, 8. doi: 10.1016/j.electacta.2012.07.048
(30) Tang, J.; Tian, X. C.; Pang,W. H.; Liu, Y. Q.; Lin, J. H.Electrochimica Acta 2012, 81, 8. doi: 10.1016/j.electacta.2012.07.048
-
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